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Janelia Research Campus Advanced Image Center (AIC) resources

Posted on 24 February 2019

Resources from the Janelia AIC, including information on access, available software and reagents as well as blog posts on a range of topics including lattice light sheet sample preparation, probes for SMLM, FIB-SEM, handling big data and more.

Learning material type: Blog

Resource Created By: Advanced Imaging Center at Janelia

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