Advertisement

Janelia Research Campus Advanced Image Center (AIC) resources

Posted on 24 February 2019

Resources from the Janelia AIC, including information on access, available software and reagents as well as blog posts on a range of topics including lattice light sheet sample preparation, probes for SMLM, FIB-SEM, handling big data and more.

Learning material type: Blog

Resource Created By: Advanced Imaging Center at Janelia

Website

You may also be interested in

symbol for thumbnail

Introduction to Modern Statistics

Free online textbook

M Çetinkaya-Rundel & J Hardin

symbol for thumbnail

Lecture from Eric Betzig: ‘Confessions of a Frustrated Optical Microscopist’

Recorded lecture and discussion with Eric Betzig

HHMI's Janelia Research Campus

symbol for thumbnail

Super-resolution microscopy hub

Compare localization software